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ALTIMET - 2015 - Altisurf 520 - 3D measuring device for surface metrology
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Lot specifications
- Quantity
- 1
- Margin
- No
- Brand
- ALTIMET
- Type
- Altisurf 520
- Year of build
- 2015
- Serial number
- 0815-A520-03/165
Description
Brand: Altimet
Model: Altisurf 520 (refurbished station, tested, new condition)
Purchase: Nov. 2023 – never used
Type: 3D
Optical Metrology Station Measuring volume: 200 × 200 × 100 mm (Z extendable)
Axes: Motorized X, Y, Z – High Precision (DC)
Flatness: < 2 μm by 200 mm
Measurement technologies:
- Non-contact: chromatic confocal, laser triangulation, interferometry
- Contact: High-resolution
μ-force probe Software: Phoenix V2 (acquisition) + PhoenixMap (3D topographic analysis)
Functions:
- Production mode with PLC + traffic
lights - Automation and measurement
scripts - Industrial
interface Compliance: ISO 4287, ISO 25178, Cleanroom, CE
Included:
- Full Altisurf 520
station - Software + camera + integrated sensors (config. to be detailed)
- Manuals + original
accessories Applications:
- Microtechnology, watchmaking
- Mechanical, automotive, polymers
- Textiles, plastic films, packaging
- Electronics, semiconductors, materials
research
Model: Altisurf 520 (refurbished station, tested, new condition)
Purchase: Nov. 2023 – never used
Type: 3D
Optical Metrology Station Measuring volume: 200 × 200 × 100 mm (Z extendable)
Axes: Motorized X, Y, Z – High Precision (DC)
Flatness: < 2 μm by 200 mm
Measurement technologies:
- Non-contact: chromatic confocal, laser triangulation, interferometry
- Contact: High-resolution
μ-force probe Software: Phoenix V2 (acquisition) + PhoenixMap (3D topographic analysis)
Functions:
- Production mode with PLC + traffic
lights - Automation and measurement
scripts - Industrial
interface Compliance: ISO 4287, ISO 25178, Cleanroom, CE
Included:
- Full Altisurf 520
station - Software + camera + integrated sensors (config. to be detailed)
- Manuals + original
accessories Applications:
- Microtechnology, watchmaking
- Mechanical, automotive, polymers
- Textiles, plastic films, packaging
- Electronics, semiconductors, materials
research
Versatile surface metrology tool, suitable for R&D, production or demanding laboratories. High accuracy and repeatability for fine 2D/3D characterization.
Additional details
The buyer is in charge of dismantling and loading his lots. Quotes for dismantling and loading are available on request at info@r-t.fr .
Pick-ups must be made by appointment from March 16 to 27.
If you would like a transport quote, please contact JMA-EXPRESS: auction@jma-express.com
